SPECIAL SESSION #4
Advancing Sensor Network Metrology for Industry 4.0 and IoT Applications
ORGANIZED BY
Shan Cui
National Metrology Centre, A*STAR, Singapore
Anupam Vedurmudi
Physikalisch-Technische Bundesanstalt, Germany
Narin Chanthawong
National Institute of Metrology, Thailand
ABSTRACT
This special session aims to explore the latest developments in sensor network metrology, focusing on its applications in Industry 4.0 and the Internet of Things (IoT). As sensor networks become increasingly complex and interconnected, there is a growing need for rigorous metrological approaches to ensure data quality and reliability. This session hope to address fundamental aspects of sensor network metrology, including calibration techniques, uncertainty propagation, and performance assessment for large-scale systems.
TOPICS
Key topics may include but limited to:
- Metrological principles for digital sensor networks
- Uncertainty evaluation for time series data in IoT applications
- Digital representation of metrological information for networked sensors
- Machine-readable and machine-actionable metrology for automated sensor networks
- Calibration, co-calibration and data-driven (or virtual) calibration techniques for sensor networks
- Sensor fault detection and diagnostics
- Metrology-assisted production and quality control in Industry 4.0
ABOUT THE ORGANIZERS
Dr. Shan Cui is the Head of the Acoustic, Chemical, and Temperature Metrology Cluster at A*STAR's National Metrology Centre (NMC). She joined NMC in October 2009 and has been instrumental in advancing research in data-driven metrology for sensing quality assurance in NMC. She was recognized as one of the Singapore's 100 Women in Tech in 2023. She is also the Chair of Asia Pacific Metrology Programme’s Focus Group on Digital Transformation and the Organising Committee Chair of the FORUM-MD Workshop on Metrology for Complex Sensor Networks held in Feb 2025.
Dr. Anupam Prasad Vedurmudi is a postdoctoral researcher at the Physikalisch-Technische Bundesanstalt in Berlin. He joined the PTB in 2020 and has contributed to research on topics such as data quality, interpolation and machine learning applied to sensor network metrology. He currently leads the work package on software frameworks and semantics in the EMP Project "Fundamental Principles of Sensor Network Metrology" (FunSNM).
Narin Chanthawong is a professional metrologist in the Dimensional Metrology Department at NIMT and a member of the Digital Transformation Center team. Actively engaged in research, they focus on the transformation of metrology and the metrology of digital transformation. Their work advances precision measurement techniques and integrates cutting-edge digital technologies into the field. With a strong passion for innovation and accuracy, Narin plays a vital role in shaping the future of metrology, ensuring it evolves alongside technological advancements. Their expertise helps industries maintain high standards of quality, precision, and reliability in an increasingly digital world.